AD data Extraction Tutorial

Follow the link below for a tutorial guide about the extraction of data suitable for programmimg the Takaya APT-9411CE Flying Probe test system.

Software packages covered:

  1. Accel
  2. ALTIUM DESIGNER
  3. Cadence Allegro
  4. CADSTAR
  5. EAGLE (output to GENCAD or FATF files)
  6. EASYPC (output to GENCAD or ODB++ files)
  7. MENTOR BOARD STATION
  8. MENTOR Expedition
  9. Orcad
  10. PADS
  11. Protel3
  12. Proteus (Ares) – Labcentre (output to ODB++ files)
  13. Pulsonix (output to GENCAD files)
  14. Visula
  15. Zuken5

Where appropriate, we use our Takaya APT-9411CE Flying Probe test system for testing populated circuit boards.

This is programmed using Siemens PLM – EM-Test Expert Software (also known as Tecnomatix Unicam FABmaster).

This software reads a wide variety of native CAD data file formats. If we are testing your circuit, you will be asked to provide this data. From these source files, data is extracted including a list of parts and values, the circuit diagram, the location of exposed and probeable pads, and their connectivity.

Native CAD data files are the best route for efficient programming. However, if they are not available, then ODB ++, GENCAD or FATF files can be used, but automatic test equipment programming takes longer.

ODB++ is printed circuit board manufacturing database format which includes gerber data, drill data, routing data, IPC-D-356 (net names, test-points and pins), mechanical drawings and component list. It is the current industry de facto standard for populated pcb data transfer. Its structure consists of a large set of files rather than one single file.

GENCAD stands for Generic Computer Aided Design file. It is a largely obsolete but useful standard. It incorporates the physical design information of electronic circuit boards. This data includes component types, component location, orientation, connectivity, pads and test points. The data content is not as comprehensive as ODB++ which is preferred.

FATF stands for FABmaster ASCII Transfer Format (FATF). It is a standard input data format for electronic circuit designs that is readable by Siemens PLM – EM-Test Expert Software.

Supported native source CAD formats are:

  • Academi
  • Accel PCB and Tango
  • Cadence Allegro
  • CADES-G
  • Cadnetix
  • Cadstar for Windows
  • Cad-ui Ariadne
  • Caiay V4
  • Computamation Vutrax
  • Computer Vision Autoboard/ THEDA
  • DDE ECAD
  • Dedaie/Decad
  • DIF (C-Link)
  • Docica
  • Eagle (GENCAD or FATF only)
  • Easy-PC (ODB++ or GENCAD only)
  • Encore PCB (Scicards)
  • FABmaster ASCII Transfer Formal (FATF)
  • GENCAD (Mitron)
  • Gencam
  • Harris EDA SCI-Cards CII
  • Hewlett-Packard PCDS, P-Link, EGS & piglet
  • LB.M. CBDS Versions 4 and 5
  • Integra
  • Mentor
  • Orcad Layout for Windows & DOS PCB386
  • PADS-Perform, PowerPCB, PADS-PCB
  • P-CAD PDIF
  • Prisma
  • Protel 3 for Windows/Protel Dos (28)
  • Proteus (ODB++ only)
  • Pulsonix (GENCAD only)
  • Redac – Cadstar (CDI)
  • Scicards
  • Siemens VCAD
  • Supermax DDE (ipi)
  • Tango
  • Theda – Incases
  • Topcad
  • Ultiboard
  • Unicad
  • Vanguard
  • Veribest ElF, GENCAD, and FATF
  • Visula CADIF
  • Vutrax
  • Zuken-Redac Visula cadExpert & CR3000/CR5000

Flying Probe Test

Takaya APT-9411-CE Flying Probe Test System

Four high speed top-sided moving probe test system.

High accuracy, X-Y positioning system – using Yaskawa AC servo motors.

Granite base unit 100mm to provide maximum stability.

High precision leadscrew and V slide mechanism to provide movement stability.

Motor Min. Positioning resolution : X & Y 1.25um Z=5Oum (approx).

Min. Probe contact pitch : 0.18mm to 0.2 mm (with straight point probe).

Positioning repeatability: +- 50um or less

Minimum contact area 150um to 200um (approx).

High speed high accuracy Z axis system for controlling contact speed &

contact pressure – using Yaskawa AC servo motors.

Probe Angles.

Probe 1 : X-12 Y-5.

Probe 2 : X-4 Y+5.

Probe 3 : X+4 Y-5.

Probe 4 : X+12 Y+5 (degrees)

Takaya Precision measurement unit

Capable of measuring low value resistance & capacitance.

Low value resistors (using 4 wire Kelvin measurement) : 40 mohm to 400 ohm.

Resistors 0.4 ohm to 40 Mohm.

Capacitors : 4pf to 40mf

Inductors : 4uH 400H

Impedance : 33 ohms 330 Kohm

Diode & Transistor Junctions : 0.1v to 2.5v.

Zener Diodes : 0.4v to 40v

DC Voltage: 0.04v to 80 v

AC Voltage : 0.04v to 50v rms (f=2KHz or less).

DC Current: 0.1A to 1.0A.

Short Detection: 1 ohm to 40 ohm programmable.

Open Detection: 10 ohm to 400 ohm.

Transistor with internal resistor : ON test.

Opto coupler: ON test

Transistor FET : On test

Relay : ON test (programmable DC 1V to 24V @ 0.5A to 1.0A

IC OPEN (in parallel bus circuit) : Two Sensors.

Internal Measurement Sources

DC constant voltage 1 : 0.2V

PDC – DC constant voltage supply 2 : 0.1v to 25V programmable DC max 0.5A to 1.0 A.

DC constant current 1 : 500nA to 5OmA.

DC constant current 2: 50uA to 2OmA.

AC constant voltage : 70m Vrms (f=l6OHz, 1.6KHz, 16KHz, 160KHz)

Guarding

Max. guarding two points per test (including bottomside probes).

Autosearch functions contained within the software

TOS-5 (Takaya Optical System), Single Camera

Camera BW with depth of field 12mm x 8mm.

Pattern Matching. Automatic Alignment & Vision Inspection Option.

Using Red Blue LED lighting for improved stable image recognition.

Easy to use image recognition software.

Multi component imaging for the same component.

For detection of:

Missing components misalignment.

Orientation check.

Pin one notch identification check.

Character recognition.

Using an optical camera system, which is incorporated into the PC monitor.

Cognix pattern matching system. High level recognition.

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